Cite
HARVARD Citation
Pennetta, C. et al. (2001). A Percolative Approach to Reliability of Thin Film Interconnects and Ultra-thin Dielectrics. VLSI design. 13 (1), pp. 363-367. [Online].
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Pennetta, C. et al. (2001). A Percolative Approach to Reliability of Thin Film Interconnects and Ultra-thin Dielectrics. VLSI design. 13 (1), pp. 363-367. [Online].