Cite
APA Citation
Poley, L., Blue, A., Bloch, I., Buttar, C., Fadeyev, V., Fernandez-Tejero, J., Fleta, C., Hacker, J., Llacer, C. L., Miñano, M., Renzmann, M., Rossi, E., Sawyer, C., Sperlich, D., Stegler, M., Ullán, M., & Unno, Y. (2019). mapping the depleted area of silicon diodes using a micro-focused X-ray beam. Journal of instrumentation, 14, P03024. http://access.bl.uk/ark:/81055/vdc_100081788374.0x00003e