Cite
HARVARD Citation
Poley, L. et al. (2019). Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. Journal of instrumentation. p. P03024. [Online].
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Poley, L. et al. (2019). Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. Journal of instrumentation. p. P03024. [Online].