Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. (22nd March 2019) - Poley, L.; Blue, A.; Bloch, I.; Buttar, C.; Fadeyev, V.; Fernandez-Tejero, J.; Fleta, C.; Hacker, J.; Llacer, C. Lacasta; Miñano, M.; Renzmann, M.; Rossi, E.; et al.