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APA Citation

    Zhu, R., Xie, H., Xue, Y., Wang, L., & Li, Y. (n.d.). fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. Measurement science & technology, 26, . http://access.bl.uk/ark:/81055/vdc_100062152121.0x00005b
  
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