Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. (21st July 2015)
- Record Type:
- Journal Article
- Title:
- Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. (21st July 2015)
- Main Title:
- Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement
- Authors:
- Zhu, Ronghua
Xie, Huimin
Xue, Yunfei
Wang, Liang
Li, YanJie - Abstract:
- Abstract: This paper deals with the characterization of influence parameters on the fabrication of speckle patterns using FIB deposition. In many manufacturing processes the presence of residual stress is disturbing, and can significantly affect the mechanical properties of materials and structures. Digital image correlation (DIC) is validated to be an effective approach for the determination of micro-scale residual stress under the dual-beam microscope (FIB-EB). Considering the high-quality micro-scale speckle pattern is the prerequisite in DIC measurement, the influence parameters on the deposited speckle patterns, such as the quality of the speckle template, total deposition time, ion beam current density, and dwell time, are primarily discussed. Moreover, in the measurement of residual stress, the integrated fabrication technique under the FIB-EB dual-beam system is also explained, covering the following steps: fabrication of the speckle pattern by FIB deposition, slot milling for stress release by FIB, high-resolution SEM imaging before and after stress release as well as the deformation analysis by DIC. As application, the optimized micro-scale speckle patterns are deposited on the surface of laser shock peened metallic glass, and the residual stress distribution on the sample surface is successfully measured.
- Is Part Of:
- Measurement science & technology. Volume 26:Number 9(2015:Sep.)
- Journal:
- Measurement science & technology
- Issue:
- Volume 26:Number 9(2015:Sep.)
- Issue Display:
- Volume 26, Issue 9 (2015)
- Year:
- 2015
- Volume:
- 26
- Issue:
- 9
- Issue Sort Value:
- 2015-0026-0009-0000
- Page Start:
- Page End:
- Publication Date:
- 2015-07-21
- Subjects:
- micro-scale speckle pattern -- digital image correlation -- focused ion beam deposition -- metallic glass -- residual stress measurement
Physical measurements -- Periodicals
Scientific apparatus and instruments -- Periodicals
Equipment and Supplies -- Periodicals
Science -- instrumentation -- Periodicals
Technology -- instrumentation -- Periodicals
Mesures physiques -- Périodiques
Physical measurements
Scientific apparatus and instruments
Periodicals
502.87 - Journal URLs:
- http://iopscience.iop.org/0957-0233/ ↗
http://www.iop.org/Journals/mt ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/0957-0233/26/9/095601 ↗
- Languages:
- English
- ISSNs:
- 0957-0233
- Deposit Type:
- Legaldeposit
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