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HARVARD Citation
Zhu, R. et al. (n.d.). Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. Measurement science & technology. p. . [Online].
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Zhu, R. et al. (n.d.). Fabrication of speckle patterns by focused ion beam deposition and its application to micro-scale residual stress measurement. Measurement science & technology. p. . [Online].