Cite
MLA Citation
Siva Kotamraju et al.. “Study of degradation in InGaP/InGaAs/Ge multi-junction solar cell characteristics due to irradiation-induced deep level traps using finite element analysis.” Solar energy, vol. 178, 2019, pp. 215–221. http://access.bl.uk/ark:/81055/vdc_100076796120.0x000051