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APA Citation
Kotamraju, S., Sukeerthi, M., Puthanveettil, S. E., & Sankaran, M. (2019). study of degradation in InGaP/InGaAs/Ge multi-junction solar cell characteristics due to irradiation-induced deep level traps using finite element analysis. Solar energy, 178, 215–221. http://access.bl.uk/ark:/81055/vdc_100076796120.0x000051