Cite
APA Citation
Nouguier, D., Pananakakis, G., Federspiel, X., Rafik, M., Roy, D., & Ghibaudo, G. (2019). on the cumulative distribution function of the defect centric model for BTI reliability. Microelectronics and reliability, 92, 168–171. http://access.bl.uk/ark:/81055/vdc_100076148729.0x000058