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APA Citation
Yadav, N., Jain, S., Pattanaik, M., & Sharma, G. (2015). a novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectronics and reliability, 55(8), 1131–1143. http://access.bl.uk/ark:/81055/vdc_100073474652.0x000001