Cite
APA Citation
Tao, P., Liang, H., Xia, X., Chen, Y., Yang, C., Liu, J., Zhu, Z., Liu, Y., Shen, R., Luo, Y., Zhang, Y., & Du, G. (n.d.). crack-free Al0.5Ga0.5N epilayer grown on SiC substrate by in situ SiNx interlayer. Materials science in semiconductor processing, 41, 291–296. http://access.bl.uk/ark:/81055/vdc_100070755332.0x00001d