Cite

MLA Citation

    Jianwei Ben et al.. “Defect evolution in AlN templates on PVD-AlN/sapphire substrates by thermal annealing.” CrystEngComm, vol. 20, no. 32, 2018, pp. 4623–4629. http://access.bl.uk/ark:/81055/vdc_100070614856.0x00003d
  
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