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APA Citation
Ben, J., Sun, X., Jia, Y., Jiang, K., Shi, Z., Liu, H., Wang, Y., Kai, C., Wu, Y., & Li, D. (2018). defect evolution in AlN templates on PVD-AlN/sapphire substrates by thermal annealing. CrystEngComm, 20(32), 4623–4629. http://access.bl.uk/ark:/81055/vdc_100070614856.0x00003d