Cite
MLA Citation
Shuang Fan et al.. “Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs.” Microelectronics and reliability, vol. 56, 2016, pp. 1–9. http://access.bl.uk/ark:/81055/vdc_100070075552.0x000050