Cite
APA Citation
Fan, S., Ning, B., Hu, Z., Zhang, Z., Bi, D., Peng, C., Song, L., & Dai, L. (2016). bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Microelectronics and reliability, 56, 1–9. http://access.bl.uk/ark:/81055/vdc_100070075552.0x000050