Cite
HARVARD Citation
Fan, S. et al. (2016). Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Microelectronics and reliability. pp. 1-9. [Online].
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Fan, S. et al. (2016). Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Microelectronics and reliability. pp. 1-9. [Online].