Cite
APA Citation
Wang, W., Khan, K., Zhang, X., Qin, H., Jiang, J., Miao, L., Jiang, K., Wang, P., Dai, M., & Chu, J. (2016). a subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors. Microelectronics and reliability, 60, 67–69. http://access.bl.uk/ark:/81055/vdc_100039237065.0x000054