Cite
MLA Citation
Etienne Brodu and Emmanuel Bouzy. “Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM).” Microscopy and microanalysis, vol. 23, 2017, pp. 1096–1106. http://access.bl.uk/ark:/81055/vdc_100057344893.0x000021