Cite
APA Citation
Brodu, E., & Bouzy, E. (2017). depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM). Microscopy and microanalysis, 23, 1096–1106. http://access.bl.uk/ark:/81055/vdc_100057344893.0x000021