Cite
APA Citation
Chen, C., Ang, G., Ng, P., Rivai, F., Ng, H., Quah, A., Teo, A., Lam, J., & Mai, Z. (2017). embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectronics and reliability, 76, 261–266. http://access.bl.uk/ark:/81055/vdc_100055920599.0x00005a