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APA Citation
Tallarico, A., Reggiani, S., Magnone, P., Croce, G., Depetro, R., Gattari, P., Sangiorgi, E., & Fiegna, C. (2017). investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. Microelectronics and reliability, 76, 475–479. http://access.bl.uk/ark:/81055/vdc_100055920535.0x00005e