Cite
MLA Citation
William A. Hubbard et al.. “In Situ STEM of Ag and Cu Conducting Bridge Formation through Al2O3 in Nanoscale Resistive Memory Devices.” Microscopy and microanalysis, vol. 20, n.d., pp. 1550–1551. http://access.bl.uk/ark:/81055/vdc_100050730912.0x000015