Cite
APA Citation
Hubbard, W. A., White, E. R., Kerelsky, A., Lodico, J. J., & Regan, B. C. (n.d.). in Situ STEM of Ag and Cu Conducting Bridge Formation through Al2O3 in Nanoscale Resistive Memory Devices. Microscopy and microanalysis, 20, 1550–1551. http://access.bl.uk/ark:/81055/vdc_100050730912.0x000015