Cite
MLA Citation
Li Ning Liu et al.. “Improved Electrical Properties and Reliability of GaAs Metal–Oxide–Semiconductor Capacitor by Using LaAlON Passivation Layer.” Physica status solidi, vol. 11, no. 9, 2017, p. n/a. http://access.bl.uk/ark:/81055/vdc_100050107128.0x00000d