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APA Citation
Liu, L. N., Choi, H. W., Xu, J. P., & Lai, P. T. (2017). improved Electrical Properties and Reliability of GaAs Metal–Oxide–Semiconductor Capacitor by Using LaAlON Passivation Layer. Physica status solidi, 11(9), n/a. http://access.bl.uk/ark:/81055/vdc_100050107128.0x00000d