Tinti, G., Marchetto, H., Vaz, C. A. F., Kleibert, A., Andrä, M., Barten, R., Bergamaschi, A., Brückner, M., Cartier, S., Dinapoli, R., Franz, T., Fröjdh, E., Greiffenberg, D., Lopez-Cuenca, C., Mezza, D., Mozzanica, A., Nolting, F., Ramilli, M., Redford, S., Ruat, M., Ruder, C., Schädler, L., Schmidt, T., Schmitt, B., Schütz, F., Shi, X., Thattil, D., Vetter, S., & Zhang, J. (2017). the EIGER detector for low‐energy electron microscopy and photoemission electron microscopy. Journal of synchrotron radiation, 24, 963–974. http://access.bl.uk/ark:/81055/vdc_100049402799.0x000058