Cite
MLA Citation
A.S.N. Pereira et al.. “An in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models.” Solid-state electronics, vol. 128, 2017, pp. 67–71. http://access.bl.uk/ark:/81055/vdc_100040778786.0x00002b