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APA Citation
Pereira, A., de Streel, G., Planes, N., Haond, M., Giacomini, R., Flandre, D., & Kilchytska, V. (2017). an in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models. Solid-state electronics, 128, 67–71. http://access.bl.uk/ark:/81055/vdc_100040778786.0x00002b