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HARVARD Citation
Pereira, A. et al. (2017). An in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models. Solid-state electronics. pp. 67-71. [Online].
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Pereira, A. et al. (2017). An in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models. Solid-state electronics. pp. 67-71. [Online].