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APA Citation
Deshpande, V., Djara, V., O'Connor, E., Hashemi, P., Balakrishnan, K., Caimi, D., Sousa, M., Czornomaz, L., & Fompeyrine, J. (2017). dC and RF characterization of InGaAs replacement metal gate (RMG) nFETs on SiGe-OI FinFETs fabricated by 3D monolithic integration. Solid-state electronics, 128, 87–91. http://access.bl.uk/ark:/81055/vdc_100040778786.0x00001b