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APA Citation
Tomaszewski, D., Głuszko, G., Łukasiak, L., Kucharski, K., & Malesińska, J. (2017). elimination of the channel current effect on the characterization of MOSFET threshold voltage using junction capacitance measurements. Solid-state electronics, 128, 92–101. http://access.bl.uk/ark:/81055/vdc_100040778786.0x00000e