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MLA Citation
S. Hofmann et al.. “Depth resolution in sputter profiling revisited.” Surface and interface analysis, vol. 48, 2016, pp. 1354–1369. http://access.bl.uk/ark:/81055/vdc_100039249699.0x000064
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S. Hofmann et al.. “Depth resolution in sputter profiling revisited.” Surface and interface analysis, vol. 48, 2016, pp. 1354–1369. http://access.bl.uk/ark:/81055/vdc_100039249699.0x000064