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APA Citation
Hofmann, S., Liu, Y., Jian, W., Kang, H., & Wang, J. (2016). depth resolution in sputter profiling revisited. Surface and interface analysis, 48, 1354–1369. http://access.bl.uk/ark:/81055/vdc_100039249699.0x000064
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Hofmann, S., Liu, Y., Jian, W., Kang, H., & Wang, J. (2016). depth resolution in sputter profiling revisited. Surface and interface analysis, 48, 1354–1369. http://access.bl.uk/ark:/81055/vdc_100039249699.0x000064