Cite
MLA Citation
Samuel Tardif et al.. “Lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering.” Journal of applied crystallography, vol. 49, no. 5, 2016, pp. 1402–1411. http://access.bl.uk/ark:/81055/vdc_100037125744.0x000062