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APA Citation
Tardif, S., Gassenq, A., Guilloy, K., Pauc, N., Osvaldo Dias, G., Hartmann, J., Widiez, J., Zabel, T., Marin, E., Sigg, H., Faist, J., Chelnokov, A., Reboud, V., Calvo, V., Micha, J., Robach, O., & Rieutord, F. (2016). lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering. Journal of applied crystallography, 49(5), 1402–1411. http://access.bl.uk/ark:/81055/vdc_100037125744.0x000062