Cite
HARVARD Citation
Tardif, S. et al. (2016). Lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering. Journal of applied crystallography. 49 (5), pp. 1402-1411. [Online].
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Tardif, S. et al. (2016). Lattice strain and tilt mapping in stressed Ge microstructures using X‐ray Laue micro‐diffraction and rainbow filtering. Journal of applied crystallography. 49 (5), pp. 1402-1411. [Online].