Cite
MLA Citation
Thomas L. Bougher et al.. “Thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation.” Nanoscale and microscale thermophysical engineering, vol. 20, no. 1, 2016, pp. 22–32. http://access.bl.uk/ark:/81055/vdc_100034279771.0x000062