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APA Citation
Bougher, T. L., Yates, L., Lo, C., Johnson, W., Graham, S., & Cola, B. A. (2016). thermal Boundary Resistance in GaN Films Measured by Time Domain Thermoreflectance with Robust Monte Carlo Uncertainty Estimation. Nanoscale and microscale thermophysical engineering, 20(1), 22–32. http://access.bl.uk/ark:/81055/vdc_100034279771.0x000062