Cite
APA Citation
Gruber, S., Krivec, S., Pobegen, G., Schwab, S., & Hutter, H. (2016). insertion behavior of sodium and potassium ions into thin CVD‐SiOx layers by means of a triangular voltage sweep method. Surface and interface analysis, 48, 636–649. http://access.bl.uk/ark:/81055/vdc_100034054776.0x000048