Cite
HARVARD Citation
Gruber, S. et al. (2016). Insertion behavior of sodium and potassium ions into thin CVD‐SiOx layers by means of a triangular voltage sweep method. Surface and interface analysis. pp. 636-649. [Online].
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Gruber, S. et al. (2016). Insertion behavior of sodium and potassium ions into thin CVD‐SiOx layers by means of a triangular voltage sweep method. Surface and interface analysis. pp. 636-649. [Online].