Cite
MLA Citation
Jeong Woo Shin and Tae-Uk Kim. “Transient response of a Mode III interface crack between piezoelectric layer and functionally graded orthotropic layer.” International journal of solids and structures, vol. 90, 2016, pp. 122–128. http://access.bl.uk/ark:/81055/vdc_100032177287.0x00005c