Cite
APA Citation
Ji, F., Xu, J., Liu, L., Tang, W., & Lai, P. (2016). a 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric. Microelectronics and reliability, 57, 24–33. http://access.bl.uk/ark:/81055/vdc_100030755427.0x000060