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APA Citation
Jordà, X., Esarte, J., Perpiñà, X., Vellvehi, M., Argandoña, G., & Aresti, M. (2015). characterization of phase change material systems using a thermal test device. Microelectronics journal, 46(12), 1195–1201. http://access.bl.uk/ark:/81055/vdc_100029835619.0x000051