Cite
MLA Citation
Dawid Kot et al.. “Composition of oxygen precipitates in Czochralski silicon wafers investigated by STEM with EDX/EELS and FTIR spectroscopy.” Physica status solidi, vol. 9, no. 7, n.d., pp. 405–409. http://access.bl.uk/ark:/81055/vdc_100025988406.0x000042