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HARVARD Citation
Kot, D. et al. (n.d.). Composition of oxygen precipitates in Czochralski silicon wafers investigated by STEM with EDX/EELS and FTIR spectroscopy. Physica status solidi. 9 (7), pp. 405-409. [Online].
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Kot, D. et al. (n.d.). Composition of oxygen precipitates in Czochralski silicon wafers investigated by STEM with EDX/EELS and FTIR spectroscopy. Physica status solidi. 9 (7), pp. 405-409. [Online].