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APA Citation
Li, Z. J., Danilewsky, A. N., Helfen, L., Mikulik, P., Haenschke, D., Wittge, J., Allen, D., McNally, P., & Baumbach, T. (2015). local strain and defects in silicon wafers due to nanoindentation revealed by full‐field X‐ray microdiffraction imaging. Journal of synchrotron radiation, 22, 1083–1090. http://access.bl.uk/ark:/81055/vdc_100025952662.0x000064