Cite
HARVARD Citation
Li, Z. et al. (2015). Local strain and defects in silicon wafers due to nanoindentation revealed by full‐field X‐ray microdiffraction imaging. Journal of synchrotron radiation. pp. 1083-1090. [Online].
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Li, Z. et al. (2015). Local strain and defects in silicon wafers due to nanoindentation revealed by full‐field X‐ray microdiffraction imaging. Journal of synchrotron radiation. pp. 1083-1090. [Online].