Cite
APA Citation
Stankevič, T., Mickevičius, S., Schou Nielsen, M., Kryliouk, O., Ciechonski, R., Vescovi, G., Bi, Z., Mikkelsen, A., Samuelson, L., Gundlach, C., & Feidenhans'l, R. (n.d.). measurement of strain in InGaN/GaN nanowires and nanopyramids. Journal of applied crystallography, 48, 344–349. http://access.bl.uk/ark:/81055/vdc_100025022748.0x000004