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APA Citation
Ren, Z., Mastropietro, F., Davydok, A., Langlais, S., Richard, M., Furter, J., Thomas, O., Dupraz, M., Verdier, M., Beutier, G., Boesecke, P., & Cornelius, T. W. (2014). scanning force microscope for in situ nanofocused X‐ray diffraction studies. Journal of synchrotron radiation, 21, 1128–1133. http://access.bl.uk/ark:/81055/vdc_100024909046.0x00004e